Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

by: Schrimpf, R. D.; Fleetwood, D. M.

Publisher: World Scientific Publishing Company ( 2004-07-29 )

ISBN-13: 9789812389404

e-ISBN-13: 9789812794703

ISBN-10: 9812389407

Language: English