Wow! eBook
Radiation Effects in Advanced Semiconductor Materials and Devices Softcover reprint of hardcover 1st ed. 2002 Edition
Author(s): C. Claeys (Author), E. Simoen (Author)
- Publisher: Springer
- Publication Date: December 1, 2010
- Edition: Softcover reprint of hardcover 1st ed. 2002
- Language: English
- Print length: 426 pages
- ISBN-10: 3642077781
- ISBN-13: 9783642077784
Book Description
Radiation defects in semiconductors have become an important factor as semiconductor device technologies include implantation. The knowledge presented here is also important for space applications. The book will appeal to researchers, engineers and advanced students.
Editorial Reviews
From the Back Cover
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today’s device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.
