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Materials Science in Microelectronics I: The Relationships Between Thin Film Processing and Structure: 1
Author(s): Eugene Machlin (Author)
- Publisher: Elsevier Science
- Publication Date: 25 Sept. 2005
- Edition: 2nd
- Language: English
- Print length: 270 pages
- ISBN-10: 9780080446400
- ISBN-13: 9780080446400
Book Description
Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.The first volume of Materials Science in Microelectronics focuses on the first relationship – that between processing and the structure of the thin-film. The state of the thin film’s surface during the period that one monolayer exists – before being buried in the next layer – determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.
