X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques
Author(s): Jinghua Guo
Publisher: Wiley-VCH
Publication Date: 27 Oct. 2010
Edition: 1st
Language: English
Print length: 275 pages
ISBN-10: 9783527322886
ISBN-13: 9783527322886
Book Description
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world’s top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging.
The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
Editorial Reviews
From the Inside Flap
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world’s top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and micrscope imaging.
The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
From the contents
High-Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and Their Spin Dynamics
Advances in Magentization Dynamics Using Scanning Transmission X-Ray Microscopy
Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials
Coherent X-Ray Diffraction Microscopy
Many-Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectrscopy
Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials
From the Back Cover
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world’s top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and micrscope imaging.
The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
From the contents
High-Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and Their Spin Dynamics
Advances in Magentization Dynamics Using Scanning Transmission X-Ray Microscopy
Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials
Coherent X-Ray Diffraction Microscopy
Many-Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectrscopy
Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials
About the Author
Jinghua Guo is a staff scientist of Advanced Light Source at Lawrence Berkeley National Laboratory. Having obtained his academic degrees from Zehjiang University, China (BS) and Uppsala University, Sweden (PhD), he spent his career working as faculty member in Uppsala University before taking up his present appointment at LBNL. His research interest has been soft x-ray spectroscopy and materials science. Dr. Guo has authored over 180 peer-reviewed scientific publications.
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