“The book is a useful resource for those interested in the field, and will probably be found to be of particular value by instrumentation support professionals and nonspecialists.” (Analytical and Bioanalytical Chemistry, 14 February 2013)
“It is an excellent text and although a competent physicist might already have grasped the principles explained in this book, the multitude of XPS users I come across (PhD chemists, engineers and pharmacists) will find this a breath of fresh air.” (Chemistry World, 1 September 2012)
The essential reference on X-ray Photoelectron Spectroscopy (XPS) and its practical applications
X-ray Photoelectron Spectroscopy represents the most heavily used of the electron spectroscopies for surface analysis. This book serves as a definitive introduction to this field by providing concise yet comprehensive coverage of all key concepts and then supplying relevant, illuminating examples of real-world applications.
Placing an emphasis on spectral understanding and interpretation, the book includes coverage of topics including: how to interpret the different spectra revealed by XPS; how they are produced and factors that can influence the spectra (including initial and final state effects); as well as how to derive speciation, volume analyzed and how to control this (including depth profiling), along with background substraction and curve-fitting methodologies. With each section standing alone, the text can be read from front to back or treated as a comprehensive resource that researchers, developers, and technicians of all levels can access as needed.
Including review questions to help readers measure their comprehension of the material, as well as a comparative review of some complementary surface analytical techniques and associated concepts, X-ray Photoelectron Spectroscopy is designed to enhance understanding of this rapidly growing field.
From the Back Cover
The essential reference on X-ray Photoelectron Spectroscopy (XPS) and its practical applications
X-ray Photoelectron Spectroscopy represents the most heavily used of the electron spectroscopies for surface analysis. This book serves as a definitive introduction to this field by providing concise yet comprehensive coverage of all key concepts and then supplying relevant, illuminating examples of real-world applications.
Placing an emphasis on spectral understanding and interpretation, the book includes coverage of topics including: how to interpret the different spectra revealed by XPS; how they are produced and factors that can influence the spectra (including initial and final state effects); as well as how to derive speciation, volume analyzed and how to control this (including depth profiling), along with background substraction and curve-fitting methodologies. With each section standing alone, the text can be read from front to back or treated as a comprehensive resource that researchers, developers, and technicians of all levels can access as needed.
Including review questions to help readers measure their comprehension of the material, as well as a comparative review of some complementary surface analytical techniques and associated concepts, X-ray Photoelectron Spectroscopy is designed to enhance understanding of this rapidly growing field.
About the Author
Dr. van der Heide currently serves as the Group Lead of the Surface Analysis department at Samsung Austin, Texas which houses state-of-the-art XPS, AES, SIMS and AFM instrumentation. Former Assistant Professor, Chemistry Department, University of Houston, TX.
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