Terrestrial Neutron-Induced Soft Error in Advanced Memory Devices

Terrestrial Neutron-Induced Soft Error in Advanced Memory Devices

by: Nakamura, Takashi; Baba, Mamoru; Ibe, Eishi; Yahagi, Yasuo; Kameyama, Hideaki

Publisher: World Scientific Publishing Company ( 2008-03-28 )

ISBN-13: 9789812778819

e-ISBN-13: 9789812778826

ISBN-10: 9812778810

Language: English