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TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES Illustrated Edition
Author(s): NAKAMURA TAKASHI ET AL (Author)
- Publisher: World Scientific Publishing
- Publication Date: 22 Jun. 2008
- Edition: Illustrated
- Language: English
- Print length: 368 pages
- ISBN-10: 9789812778819
- ISBN-13: 9812778810
Book Description
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
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