Terrestrial Neutron-Induced Soft Error in Advanced Memory Devices
by: Nakamura, Takashi; Baba, Mamoru; Ibe, Eishi; Yahagi, Yasuo; Kameyama, Hideaki
Publisher: World Scientific Publishing Company ( 2008-03-28 )
ISBN-13: 9789812778819
e-ISBN-13: 9789812778826
ISBN-10: 9812778810
Language: English