Reliability Wearout Mechanisms in Advanced CMOS

2014-01-07 分类：未分类

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Hardcover: 642 pages

Publisher: Wiley (October 13, 2009)

Language: English

ISBN-10: 0471731722

ISBN-13: 9780471731726

电子书代发PDF格式价格10元我要求助