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Professional Test Driven Development with C#: Developing Real World Applications with TDD

2021-02-16 分类:计算机与技术

Professional Test Driven Development with C#: Developing Real World Applications with TDD

by: Bender, James; McWherter, Jeff; McWherter, Jeff

Publisher: Wiley(2011/5/9)

Edition: 1

Language: English

ISBN-13: 9780470643204

e-ISBN-13: 9781118102114

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