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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

2016-07-22 分类:物理学

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by: R.F. Egerton

ISBN-10: 3319398768

ISBN-13: 9783319398761

Edition: 2nd ed. 2016
Released: 2016-08-02

Hardcover: 181 pages
List Price

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