
Infrared Characterization for Microelectronics
Author(s): Wai Shing Lau (Author)
- Publisher: World Scientific Publishing Co Pte Ltd
- Publication Date: 28 April 1996
- Edition: Illustrated
- Language: English
- Print length: 172 pages
- ISBN-10: 9810223528
- ISBN-13: 9789810223526
Book Description
Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.
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