Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes)

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes) book cover

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes)

Author(s): Richard Haight (Author, Editor), Frances M. Ross (Editor), James B. Hannon (Editor)

  • Publisher: World Scientific Publishing Co Pte Ltd
  • Publication Date: 30 Nov. 2011
  • Language: English
  • Print length: 1050 pages
  • ISBN-10: 9814322806
  • ISBN-13: 9789814322805

Book Description

Nanoscience and nanotechnology is an exciting and vibrant field of research. This new handbook, intended for researchers, engineers and advanced graduate students in all areas of nanoscience, is written by eminent scientists and experts who are pushing the forefront of instrumentation and developing key techniques for the study of atomic structural, optical and electronic properties of nanostructured semiconductor materials. This handbook will be a key resource for all researchers in nanoscience and nanomaterials interested in learning about the most important techniques for unlocking the detailed science and properties of nanostructures.

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From the Back Cover

Nanoscience and nanotechnology is an exciting and vibrant field of research. This new handbook, intended for researchers, engineers and advanced graduate students in all areas of nanoscience, is written by eminent scientists and experts who are pushing the forefront of instrumentation and developing key techniques for the study of atomic structural, optical and electronic properties of nanostructured semiconductor materials. This handbook will be a key resource for all researchers in nanoscience and nanomaterials interested in learning about the most important techniques for unlocking the detailed science and properties of nanostructures.

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