
Guide To Characteristics And Characterization Of Semiconductor Surfaces
Author(s): Jerzy Ruzyllo (Author)
- Publisher: WSPC
- Publication Date: 14 April 2025
- Language: English
- Print length: 218 pages
- ISBN-10: 9811254818
- ISBN-13: 9789811254819
Book Description
Editorial Reviews
About the Author
Jerzy Ruzyllo is a Distinguished Professor Emeritus in the School of Electrical Engineering and Computer Science at the Pennsylvania State University. He joined Penn State in 1984 after completing his education, obtaining a PhD degree in 1977, and serving on the faculty of the Warsaw University of Technology. Throughout his career, Dr Ruzyllo was actively involved in research and teaching in the area of semiconductor science and engineering with emphasis on processing and characterization of semiconductor surfaces. Over the years, he was among the leaders initiating and running, as well as editing proceedings volumes, of the series of international conferences on processing of semiconductor surfaces. Dr Ruzyllo is the author of over 200 research papers and two books published by the World Scientific Publishing Co., Guide to Semiconductor Engineering (2020), and Semiconductor Glossary (2016). Dr Ruzyllo is a Life Fellow of IEEE and Fellow of the Electrochemical Society.
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