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Ellipsometry of Functional Organic Surfaces and Films Softcover Reprint of the Original 1st 2014 ed. Edition
Author(s): Karsten Hinrichs (Editor), Klaus-Jochen Eichhorn
- Publisher: Springer
- Publication Date: August 23, 2016
- Edition: Softcover Reprint of the Original 1st 2014 ed.
- Language: English
- Print length: 388 pages
- ISBN-10: 3662510200
- ISBN-13: 9783662510209
Book Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Editorial Reviews
From the Back Cover
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
