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Computed Electron Micrographs and Defect Identification
Author(s): A.K. Head (Author), etc. (Author)
- Publisher: Elsevier Science Publishing Co Inc.,U.S.
- Publication Date: 1 Nov. 1973
- Language: English
- Print length: 406 pages
- ISBN-10: 0720417570
- ISBN-13: 9780720417579
