Wow! eBook
Characterization of Organic Thin Films Reissue Edition
Author(s): Abraham Ulman (author) (Author)
- Publisher: Momentum Press
- Publication Date: 1 Jan. 2010
- Edition: Reissue
- Language: English
- Print length: 276 pages
- ISBN-10: 9781606500446
- ISBN-13: 9781606500446
Book Description
Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the “Materials Characterization” series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. The readers will find detailed information on: various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy; X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy; and concise summaries of major characterization technologies for organic thin films, including, Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and, Transmission Electron Microscopy (TEM).
Editorial Reviews
About the Author
Abraham Ulman
