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Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes Softcover reprint of the original 1st ed. 2013 Edition
Author(s): Pei Zhang (Author)
- Publisher: Springer
- Publication Date: 23 Aug. 2016
- Edition: Softcover reprint of the original 1st ed. 2013
- Language: English
- Print length: 130 pages
- ISBN-10: 3319346164
- ISBN-13: 9783319346168
Book Description
This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics.
Editorial Reviews
From the Back Cover
This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as researchers familiar with this topic. Pei Zhang’s achievements will serve as a basis for the development of similar monitors at various other facilities around the world.
About the Author
The author read physics at the University of Science and Technology of China (USTC) in Hefei from 2002 to 2006. After graduating with a BSc in applied physics, he worked at CERN in Geneva for one year as a visiting scholar employed by the University of Michigan (Ann Arbor). In 2009, he was awarded a MSc in Particle Physics from USTC. Subsequently he joined the accelerator group at the University of Manchester to pursue a Ph.D. and was based at DESY (Hamburg). After successfully defending his Ph.D. thesis in December 2012, he joined the BE-RF group at CERN as a Marie-Curie Experienced Researcher.
