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Applied RHEED: Reflection High-Energy Electron Diffraction During Crystal Growth: 154 Softcover reprint of the original 1st ed. 1999 Edition
Author(s): Wolfgang Braun (Author)
- Publisher: Springer
- Publication Date: 20 Nov. 2013
- Edition: Softcover reprint of the original 1st ed. 1999
- Language: English
- Print length: 229 pages
- ISBN-10: 3662156148
- ISBN-13: 9783662156148
Book Description
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Editorial Reviews
Review
Anyone interested in L.-M. Peng’s chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail…
Ultramicroscopy, 2001/87
Ultramicroscopy, 2001/87
From the Back Cover
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
