Advances in Speckle Metrology and Related Techniques
Author(s): Guillermo H. Kaufmann
Publisher: Wiley-VCH
Publication Date: April 11, 2011
Edition: 1st
Language: English
Print length: 327 pages
ISBN-10: 3527409572
ISBN-13: 9783527409570
Book Description
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.
This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.
Editorial Reviews
Review
“Each chapter presents a systematic exposition describing the techniques and applications, with all necessary formulae, and concluding with a full list of references, making this an ideal resource for the graduate student seminar as well as for engineers and scientists.” (Book News, 1 August 2011)
From the Back Cover
Speckle metrology includes various optical techniques that are based on the speckle fields generated by scattering from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.
This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, fringe analysis, and digital data security.
From the contents:
Radical Speckle Interferometry and Applications
Depth-Resolved Displacement Field Measurement
Single-Image Interferogram Demodulation
Phase Evaluation in Temporal Speckle Pattern Interferometry using Time-Frequency Methods
Optical Vortex Metrology
Speckle Coding for Optical and Digital Data Security Applications
About the Author
Prof. Guillermo H. Kaufmann is professor of Applied Optics at the National University of Rosario, Argentina, and chief scientist at the Physics Institute of Rosario which is linked both to the university and to the National Council of Scientific and Technological Research. He is also the director of the French-Argentine International Centre for Information and Systems Sciences. He has worked as a visiting researcher at the National Physical Laboratory, UK, the University of Michigan, and Loughborough University. Professor Kaufmann has co-authored more than 170 papers published in international journals and conference proceedings and several book chapters. He is a fellow member of both SPIE and the Optical Society of America. In 2003 the Secretary of Science and Technology of Argentina awarded him the Bernardo Houssay Prize for his contributions to the field of optical engineering.
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