Advances in Imaging and Electron Physics: Part B: 173: Volume 173

Advances in Imaging and Electron Physics: Part B: 173: Volume 173 book cover

Advances in Imaging and Electron Physics: Part B: 173: Volume 173

Author(s): Ted Cremer (Author)

  • Publisher: Academic Press
  • Publication Date: 1 Aug. 2012
  • Language: English
  • Print length: 360 pages
  • ISBN-10: 0123969697
  • ISBN-13: 9780123969699

Book Description

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Editorial Reviews

Review

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

View on Amazon

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Advances in Imaging and Electron Physics: Part A: Volume 172

Advances in Imaging and Electron Physics: Part A: Volume 172 book cover

Advances in Imaging and Electron Physics: Part A: Volume 172

Author(s): Ted Cremer (Author)

  • Publisher: Academic Press
  • Publication Date: 13 July 2012
  • Language: English
  • Print length: 360 pages
  • ISBN-10: 0123944228
  • ISBN-13: 9780123944221

Book Description

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Editorial Reviews

Review

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

View on Amazon

电子书代发PDF格式价格30我要求助
未经允许不得转载:Wow! eBook » Advances in Imaging and Electron Physics: Part A: Volume 172