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Silicon-Based Millimetre-wave Technology (Advances in Imaging and Electron Physics): Volume 174
Author(s): Jamal Deen (Author)
- Publisher: Academic Press
- Publication Date: 13 Dec. 2012
- Edition: 1st
- Language: English
- Print length: 360 pages
- ISBN-10: 0123942985
- ISBN-13: 9780123942982
Book Description
Advances in Imaging and Electron Physics merges two long-running serials–Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Editorial Reviews
Review
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
