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Advances in Imaging and Electron Physics: Silicon-Based Millimetre-wave Technology
Author(s): Jamal Deen (Editor, Other Contributor)
- Publisher: Academic Press
- Publication Date: November 1, 2012
- Edition: 1st
- Language: English
- Print length: 484 pages
- ISBN-10: 9781283736244
- ISBN-13: 9780123946362
Book Description
Advances in Imaging and Electron Physics merges two long-running serials–Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
– Contributions from leading authorities
– Contributions from leading authorities
– Informs and updates on all the latest developments in the field
