Advanced Production Testing of RF, SoC, and SiP Devices

Advanced Production Testing of RF, SoC, and SiP Devices book cover

Advanced Production Testing of RF, SoC, and SiP Devices

Author(s): Joe Kelly (Author), Michael D. Engelhardt (Author)

  • Publisher: Artech House
  • Publication Date: January 11, 2007
  • Edition: 1st
  • Language: English
  • Print length: 326 pages
  • ISBN-10: 158053709X
  • ISBN-13: 9781580537094

Book Description

Engineers Kelly and Engelhardt present a follow-up to the 2004 Production Testing of RF and System-on-a-Chip Devices for Wireless Communications by Keith Schaub and Joe Kelly. They explain more advanced topics in testing radio-frequency (RF) and system-on-a-chip (SoC) devices and the peripherals associated with that testing. They write primarily for applications engineers, engineering managers, product engineers, and students who have either digested the earlier book or otherwise acquired the fundamentals. Annotation ©2007 Book News, Inc., Portland, OR (booknews.com)

Editorial Reviews

About the Author

Joe Kelly is a Wireless Center of Expertise senior RF technical consultant at Agilent Technologies. He is also the coauthor of Production Testing of RF and System-on-a-Chip Devices (Artech House, 2004) and a frequent presenter at international conferences and workshops. Dr. Kelly earned his Ph.D. at Rutgers University. Michael D. Engelhardt is a senior RF applications engineer at Agilent Technologies. He holds an M.S. in electrical engineering from the University of Ulm, Germany and an M.B.A. from the University of Dallas. Mr. Engelhardt has written several papers for major international conferences.

View on Amazon

电子书代发PDF格式价格30我要求助
未经允许不得转载:Wow! eBook » Advanced Production Testing of RF, SoC, and SiP Devices