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Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy 2008th Edition

Author(s): José A. Gutierrez (Author), Brian S.R. Armstrong (Author)

Springer | 2007 | English | 9781846289125 | 173 pages

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English | 9789389447941

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Podzun-Pallas | 2001 | German | 9783790907292

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German | 9783648173787

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McGraw Hill | 2024 | English | 9781266005596 | 320 pages

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Aleph Book Company | 2019 | English | 9789388292771 | 440 pages

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The History | 2024 | English | 9781803994154 | 192 pages

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Morton Company | 2018 | English | 9781617317552 | 848 pages

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Grange | 2004 | English | 9781840136821 | 192 pages

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Square Peg | 2024 | English | 9781529110449

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