VLSI Test Principles and Architectures: Design for Testabili girro 2015年6月1日 17 阅读 0 评论 工程 VLSI Test Principles and Architectures: Design for Testabili by: Laung-Teg Wang, Cheng-Wen Wu, Xiaoqing Wen Publisher: Morgan Print length: 808 Publication date: 2006-07-07 ISBN-10: 0123705975 ISBN-13: 9780123705976 代发服务PDF电子书10元立即求助