The Physics of SiO2 and Its Interfaces: Proceedings of the Inteational Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24, 1978

The Physics of SiO2 and Its Interfaces:Proceedings of the Inteational Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24, 1978

by: Pantelides, Sokrates T

Publisher: Elsevier Science ( 2013/9/17 )

ISBN-13: 9780080230498

e-ISBN-13: 9781483139005

ISBN-10: 0080230490

Language: English

Category:Science; Science:Chemistry; Science:Physics