SYSTEM AND BAYESIAN RELIABILITY: ESSAYS IN HONOR OF PROFESSOR RICHARD E BARLOW ON HIS 70TH BIRTHDAY (Series on Quality, Reliability and Engineering Statistics)
Author(s):Telba Irony (Author, Editor), Min Xie (Author, Editor), Yu Hayakawa (Editor), Richard E. Barlow (Editor)
- Publisher: World Scientific Pub Co Inc
- Publication Date: December 21, 2001
- Edition: Illustrated
- Language: English
- Print length: 409 pages
- ISBN-10: 9810248652
- ISBN-13: 9789810248659
Book Description
This volume is a collection of articles on reliability systems and Bayesian reliability analysis. Written by reputable researchers, the articles are self-contained and are linked with literature reviews and new research ideas. The book is dedicated to Emeritus Professor Richard E Barlow, who is well known for his pioneering research on reliability theory and Bayesian reliability analysis.
Editorial Reviews
Review
"This volume is a welcome and fitting 70th birthday gift.?