System and Bayesian Reliability: Essays in Honor of Professor Richard E Barlow on His 70th Birthday

SYSTEM AND BAYESIAN RELIABILITY: ESSAYS IN HONOR OF PROFESSOR RICHARD E BARLOW ON HIS 70TH BIRTHDAY (Series on Quality, Reliability and Engineering Statistics) book cover

SYSTEM AND BAYESIAN RELIABILITY: ESSAYS IN HONOR OF PROFESSOR RICHARD E BARLOW ON HIS 70TH BIRTHDAY (Series on Quality, Reliability and Engineering Statistics)

Author(s):Telba Irony (Author, Editor), Min Xie (Author, Editor), Yu Hayakawa (Editor), Richard E. Barlow (Editor)

  • Publisher:‎ World Scientific Pub Co Inc
  • Publication Date:‎ December 21, 2001
  • Edition:‎ Illustrated
  • Language:‎ English
  • Print length:‎ 409 pages
  • ISBN-10:‎ 9810248652
  • ISBN-13:‎ 9789810248659

Book Description

This volume is a collection of articles on reliability systems and Bayesian reliability analysis. Written by reputable researchers, the articles are self-contained and are linked with literature reviews and new research ideas. The book is dedicated to Emeritus Professor Richard E Barlow, who is well known for his pioneering research on reliability theory and Bayesian reliability analysis.

Editorial Reviews

Review

"This volume is a welcome and fitting 70th birthday gift.?

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