Stress and Strain in Epitaxy: Theoretical Concepts, Measurem

物理学

Stress and Strain in Epitaxy: Theoretical Concepts, Measurem

by: J.-P. Deville, M. Hanbucken

Publisher: Elsevier Science

Print length: 450

Publication Date: 2001-07-01

ISBN-10: 0444508651

ISBN-13: 9780444508652

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