Reliability and Failure of Electronic Materials and Devices
Authors: Ohring, Milton; Kasprzak, Lucian
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Publisher: Elsevier Science ( 2014-11-03 )
ISBN-13: 9780120885749
e-ISBN-13: 9780080575520
ISBN-10: 0120885743
QQ: 7450911
Edition: 2
Language: English
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