Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
by: Schrimpf, R. D.; Fleetwood, D. M.
Publisher: World Scientific Publishing Company ( 2004-07-29 )
ISBN-13: 9789812389404
e-ISBN-13: 9789812794703
ISBN-10: 9812389407
Language: English
未经允许不得转载：Wow! eBook » Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices