Power-Constrained Testing of VLSI Circuits (Frontiers in Ele

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Power-Constrained Testing of VLSI Circuits (Frontiers in Ele

by: Nicola Nicolici, Bashir M. Al-Hashimi

Print length: 180

Publication date: 2003-02-28

ISBN-10: 140207235X

ISBN-13: 9781402072352

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