Oxide Reliability:A Summary of Silicon Oxide Wearout, Breakdown, and Reliability
by: Dumin, D. J
Publisher: World Scientific Publishing Company ( 2002-01-18 )
ISBN-13: 9789810248420
e-ISBN-13: 9789812778062
ISBN-10: 9810248423
Language: English
未经允许不得转载：Wow! eBook » Oxide Reliability:A Summary of Silicon Oxide Wearout, Breakdown, and Reliability