Measurement and Modeling of Silicon Heterostructure Devices

girro 7 阅读 0 评论
物理学

Measurement and Modeling of Silicon Heterostructure Devices

by: John D. Cressler

Publisher: CRC

Print length: 200

Publication Date: 2007-12-13

ISBN-10: 1420066927

ISBN-13: 9781420066920

代发服务PDF电子书10元立即求助