Image Analysis:22nd Scandinavian Conference, SCIA 2023, Sirkka, Finland, April 18–21, 2023, Proceedings, Part I. (Lecture Notes in Computer Science)

Image Analysis:22nd Scandinavian Conference, SCIA 2023, Sirkka, Finland, April 18–21, 2023, Proceedings, Part I. (Lecture Notes in Computer Science)

by: Rikke Gade (Editor),Michael Felsberg (Editor),Joni-Kristian Kämäräinen (Editor)&0more

Publisher: Springer

Edition: 1st ed. 2023

Publication Date: 2023/4/27

Language: English

Print Length: 468 pages

ISBN-10: 3031314344

ISBN-13: 9783031314346

Book Description

This two-volume set (LNCS 13885-13886) constitutes the refereed proceedings of the 23rd Scandinavian Conference on Image Analysis, SCIA 2023, held in Lapland, Finland, in April 2023.The 67 revised papers presented were carefully reviewed and selected from 108 submissions. The contributions are structured in topical sections on datasets and evaluation; action and behaviour recognition; image and video processing, analysis, and understanding; detection, recognition, classification, and localization in 2D and/or 3D; machine leaing and deep leaing; segmentation, grouping, and shape; vision for robotics and autonomous vehicles; biometrics, faces, body gestures and pose; 3D vision from multiview and other sensors; vision applications and systems.

About the Author

This two-volume set (LNCS 13885-13886) constitutes the refereed proceedings of the 23rd Scandinavian Conference on Image Analysis, SCIA 2023, held in Lapland, Finland, in April 2023.The 67 revised papers presented were carefully reviewed and selected from 108 submissions. The contributions are structured in topical sections on datasets and evaluation; action and behaviour recognition; image and video processing, analysis, and understanding; detection, recognition, classification, and localization in 2D and/or 3D; machine leaing and deep leaing; segmentation, grouping, and shape; vision for robotics and autonomous vehicles; biometrics, faces, body gestures and pose; 3D vision from multiview and other sensors; vision applications and systems.

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