Helium Ion Microscopy: Principles and Applications

2013-09-13 分类：科学

Helium Ion Microscopy:Principles and Applications

by: Joy, David C

Publisher: Springer ( 2013/9/13 )

ISBN-13: 9781461486596

e-ISBN-13: 9781461486602

ISBN-10: 1461486599

Edition: 1

Language: English

Category:Science; Engineering; Science:Biology / Natural History

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