Fringe Patte Analysis for Optical Metrology: Theory, Algorithms, and Applications

Fringe Patte Analysis for Optical Metrology:Theory, Algorithms, and Applications

by: Servin, Manuel; Quiroga, J. Antonio; Padilla, Moises

Publisher: Wiley ( 2014-05-27 )

ISBN-13: 9783527411528

e-ISBN-13: 9783527681082

ISBN-10: 3527411526

Edition: 1

Language: English