Electromigration in Thin Films and Electronic Devices: Materials And Reliability

Electromigration in Thin Films and Electronic Devices: Materials And Reliability

by: Kim, C-U

Publisher: Elsevier Science ( 2011-08-28 )

ISBN-13: 9781845699376

e-ISBN-13: 9780857093752

ISBN-10: 1845699378

Language: English