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Electromigration in Thin Films and Electronic Devices: Materials And Reliability

2011-08-28 分类：工程

Electromigration in Thin Films and Electronic Devices:Materials And Reliability

by: Kim, C-U

Publisher: Elsevier Science ( 2011-08-28 )

ISBN-13: 9781845699376

e-ISBN-13: 9780857093752

ISBN-10: 1845699378

Language: English

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