Electromigration in Thin Films and Electronic Devices: Materials And Reliability
Authors: Kim, C-U
Get this book Contact Email: girro@qq.com
Publisher: Elsevier Science ( 2011-08-28 )
ISBN-13: 9781845699376
e-ISBN-13: 9780857093752
ISBN-10: 1845699378
QQ: 7450911
Language: English
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