CMOS SRAM Circuit Design and Parametric Test in girro 2014年2月1日 17 阅读 0 评论 农业 CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) Hardcover: 212 pages Publisher: Springer (June 23, 2008) Language: English ISBN-10: 1402083629 代发服务PDF电子书10元立即求助