 

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

2022-11-22 分类：工程

Atomic Force Microscopy:Understanding Basic Modes and Advanced Applications

by: Haugstad, Greg

Publisher: Wiley(2012/9/4)

Edition: 1

Language: English

ISBN-13: 9780470638828

e-ISBN-13: 9781118360682

代发服务PDF电子书10元立即求助

1111

 打赏