Atomic Force Microscopy:Understanding Basic Modes and Advanced Applications
by: Haugstad, Greg
Publisher: Wiley(2012/9/4)
Edition: 1
Language: English
ISBN-13: 9780470638828
e-ISBN-13: 9781118360682
未经允许不得转载：Wow! eBook » Atomic Force Microscopy:Understanding Basic Modes and Advanced Applications