VLSI Test Principles and Architectures: Design for Testabili

VLSI Test Principles and Architectures: Design for Testabili

by: Laung-Teg Wang, Cheng-Wen Wu, Xiaoqing Wen

Publisher: Morgan

Print length: 808

Publication date: 2006-07-07

ISBN-10: 0123705975

ISBN-13: 9780123705976