Reliability Modeling with Applications: Essays in Honor of Professor Toshio Nakagawa on His 70th Birthday

Reliability Modeling with Applications: Essays in Honor of Professor Toshio Nakagawa on His 70th Birthday

by: Nakamura, Syouji; Qian, Cun Hua; Chen, Mingchih

Publisher: World Scientific Publishing Company ( 2013-12-12 )

ISBN-13: 9789814571937

e-ISBN-13: 9789814571944

ISBN-10: 9814571938

Language: English