CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
Hardcover: 212 pages
Publisher: Springer (June 23, 2008)
Language: English
ISBN-10: 1402083629
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
Hardcover: 212 pages
Publisher: Springer (June 23, 2008)
Language: English
ISBN-10: 1402083629

